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  • 1.
    Adamczyk, Krzysztof
    et al.
    Department of Materials Science and Engineering, Trondheim, Norway.
    Søndenå, Rune
    Department for Solar Energy, IFE, Kjeller, Norway.
    Stokkan, Gaute
    Sintef Materials and Chemistry, Trondheim, Norway.
    Looney, Erin
    Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
    Jensen, Mallory
    Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
    Lai, Barry
    Advanced Photon Source, Argonne National Laboratory, Lemont, Illinois 60439, USA.
    Rinio, Markus
    Karlstads universitet, Fakulteten för hälsa, natur- och teknikvetenskap (from 2013), Institutionen för ingenjörsvetenskap och fysik (from 2013).
    Di Sabatino, Marisa
    Department of Materials Science and Engineering, NTNU, A. Getz vei 2B, NO-7491 Trondheim, Norway.
    Recombination activity of grain boundaries in high-performance multicrystalline Si during solar cell processing2018Inngår i: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 123, nr 5, s. 1-6, artikkel-id 055705Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    In this work, we applied internal quantum efficiency mapping to study the recombination activity of grain boundaries in High Performance Multicrystalline Silicon under different processing conditions. Wafers were divided into groups and underwent different thermal processing, consisting of phosphorus diffusion gettering and surface passivation with hydrogen rich layers. After these thermal treatments, wafers were processed into heterojunction with intrinsic thin layer solar cells. Light Beam Induced Current and Electron Backscatter Diffraction were applied to analyse the influence of thermal treatment during standard solar cell processing on different types of grain boundaries. The results show that after cell processing, most random-angle grain boundaries in the material are well passivated, but small-angle grain boundaries are not well passivated. Special cases of coincidence site lattice grain boundaries with high recombination activity are also found. Based on micro-X-ray fluorescence measurements, a change in the contamination level is suggested as the reason behind their increased activity.

  • 2.
    Adamczyk, Krzysztof
    et al.
    Department of Materials Science and Engineering, Trondheim, Norway.
    Søndenå, Rune
    Department for Solar Energy, IFE, Kjeller, Norway.
    You, Chang Chuan
    Department for Solar Energy, IFE, Kjeller, Norway.
    Stokkan, Gaute
    Sintef Materials and Chemistry, Trondheim, Norway.
    Lindroos, Jeanette
    Karlstads universitet, Fakulteten för hälsa, natur- och teknikvetenskap (from 2013), Institutionen för ingenjörsvetenskap och fysik (from 2013).
    Rinio, Markus
    Karlstads universitet, Fakulteten för hälsa, natur- och teknikvetenskap (from 2013), Institutionen för ingenjörsvetenskap och fysik (from 2013).
    Di Sabatino, Marisa
    Department of Materials Science and Engineering, Trondheim, Norway.
    Recombination Strength of Dislocations in High-Performance Multicrystalline/Quasi-Mono Hybrid Wafers During Solar Cell Processing2018Inngår i: Physica Status Solidi (a) applications and materials science, ISSN 1862-6300, E-ISSN 1862-6319, Vol. 215, nr 2, artikkel-id 1700493Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    Wafers from a hybrid silicon ingot seeded in part for High Performance Multicrystalline, in part for a quasi-mono structure, are studied in terms of the effect of gettering and hydrogenation on their final Internal Quantum Efficiency.The wafers are thermally processed in different groups – gettered and hydrogenated. Afterwards, a low temperature heterojunction with intrinsic thin layer cell process is applied to minimize the impact of temperature. Such procedure made it possible to study the effect of different processing steps on dislocation clusters in the material using the Light Beam Induced Current technique with a high spatial resolution. The dislocation densities are measuredusing automatic image recognition on polished and etched samples. The dislocation recombination strengths are obtained by a correlation of the IQE with the dislocation density according to the Donolato model. Different clusters are compared after different process steps. The results show that for the middle of the ingot, the gettering step can increase the recombination strength of dislocations by one order of magnitude. A subsequent passivation with layers containing hydrogen can lead to a decrease in the recombination strength to levels lower than in ungettered samples.

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