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  • 1.
    Gustafsson, Oscar
    et al.
    KT.
    Karim, Amir
    Acreo AB, Sweden.
    Berggren, Jesper
    KTH.
    Wang, Qin
    Acreo AB, Sweden.
    Reuterskiöld-Hedlund, Carl
    KTH.
    Ernerheim-Jokumsen, Christopher
    KTH.
    Soldemo, Markus
    KTH.
    Weissenrieder, Jonas
    KTH.
    Persson, Sirpa
    Acreo AB, Sweden.
    Almqvist, Susanne
    Acreo AB, Sweden.
    Ekenberg, Ulf
    KTH.
    Noharet, Bertrand
    Asplund, Carl
    IRnova AB, Sweden.
    Göthelid, Mats
    KTH.
    Andersson, Jan Y.
    Acreo AB, Sweden.
    Hammar, Mattias
    KTH.
    Photoluminescence and photoresponse from InSb/InAs-based quantum dot structures2012In: Optics Express, ISSN 1094-4087, E-ISSN 1094-4087, Vol. 20, no 19, p. 21264-21271Article in journal (Refereed)
    Abstract [en]

    InSb-based quantum dots grown by metal-organic vapor-phase epitaxy (MOVPE) on InAs substrates are studied for use as the active material in interband photon detectors. Long-wavelength infrared (LWIR) photoluminescence is demonstrated with peak emission at 8.5 mu m and photoresponse, interpreted to originate from type-II interband transitions in a p-i-n photodiode, was measured up to 6 mu m, both at 80 K. The possibilities and benefits of operation in the LWIR range (8-12 mu m) are discussed and the results suggest that InSb-based quantum dot structures can be suitable candidates for photon detection in the LWIR regime.

  • 2.
    Selin, Mårten
    et al.
    KTH.
    Fogelqvist, Emelie
    KTH.
    Holmberg, Anders
    KTH.
    Guttmann, Peter
    Vogt, Ulrich
    KTH.
    Hertz, Hans M.
    KTH.
    3D simulation of the image formation in soft x-ray microscopes2014In: Optics Express, ISSN 1094-4087, E-ISSN 1094-4087, Vol. 22, no 25, p. 30756-30768Article in journal (Refereed)
    Abstract [en]

    In water-window soft x-ray microscopy the studied object is typically larger than the depth of focus and the sample illumination is often partially coherent. This blurs out-of-focus features and may introduce considerable fringing. Understanding the influence of these phenomena on the image formation is therefore important when interpreting experimental data. Here we present a wave-propagation model operating in 3D for simulating the image formation of thick objects in partially coherent soft x-ray microscopes. The model is compared with present simulation methods as well as with experiments. The results show that our model predicts the image formation of transmission soft x-ray microscopes more accurately than previous models.

  • 3.
    Uhlén, Fredrik
    et al.
    KTH.
    Nilsson, Daniel
    KTH.
    Holmberg, Anders
    KTH.
    Hertz, Hans M.
    KTH.
    Schroer, C. G.
    Seiboth, F.
    Patommel, J.
    Meier, V.
    Hoppe, R.
    Schropp, A.
    Lee, H. J.
    Nagler, B.
    Galtier, E.
    Krzywinski, J.
    Sinn, H.
    Vogt, Ulrich
    KTH.
    Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser2013In: Optics Express, ISSN 1094-4087, E-ISSN 1094-4087, Vol. 21, no 7, p. 8051-8061Article in journal (Refereed)
    Abstract [en]

    Focusing hard x-ray free-electron laser radiation with extremely high fluence sets stringent demands on the x-ray optics. Any material placed in an intense x-ray beam is at risk of being damaged. Therefore, it is crucial to find the damage thresholds for focusing optics. In this paper we report experimental results of exposing tungsten and diamond diffractive optics to a prefocused 8.2 keV free-electron laser beam in order to find damage threshold fluence levels. Tungsten nanostructures were damaged at fluence levels above 500 mJ/cm(2). The damage was of mechanical character, caused by thermal stress variations. Diamond nanostructures were affected at a fluence of 59 000 mJ/cm(2). For fluence levels above this, a significant graphitization process was initiated. Scanning Electron Microscopy (SEM) and mu-Raman analysis were used to analyze exposed nanostructures.

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