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Copper-related light-induced degradation in crystalline silicon
Karlstad University, Faculty of Health, Science and Technology (starting 2013), Department of Engineering and Physics.ORCID iD: 0000-0002-4569-5788
2015 (English)Doctoral thesis, comprehensive summary (Other academic)
Place, publisher, year, edition, pages
Helsinki: Unigrafia , 2015.
Series
, Aalto University publication series DOCTORAL DISSERTATIONS, ISSN 1799-4942 ; 37/2015
Keyword [en]
copper, degradation, lifetime, nickel, silicon
Keyword [sv]
degradering, kisel, koppar, livstid, nickel
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:kau:diva-37275ISBN: 978-952-60-6130-6OAI: oai:DiVA.org:kau-37275DiVA: diva2:844230
Public defence
2015-04-24, Hall E, Aalto University School of Electrical Engineering, Espoo, Finland, 12:00 (English)
Opponent
Supervisors
Available from: 2015-08-05 Created: 2015-08-04 Last updated: 2015-08-05Bibliographically approved

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Lindroos, Jeanette
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ReferencesLink to record
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