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Formation kinetics of copper-related light-induced degradation in crystalline silicon
Department of Micro- and Nanosciences, Aalto University, Finland.ORCID iD: 0000-0002-4569-5788
2014 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 116, no 23, 234901Article in journal (Refereed) Published
Place, publisher, year, edition, pages
American Institute of Physics (AIP), 2014. Vol. 116, no 23, 234901
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Condensed Matter Physics
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URN: urn:nbn:se:kau:diva-37261DOI: 10.1063/1.4904197ISI: 000346634500047OAI: diva2:844082
Available from: 2015-08-03 Created: 2015-08-03 Last updated: 2016-08-10Bibliographically approved

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Lindroos, Jeanette
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