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Light-induced degradation in copper-contaminated gallium-doped silicon
Department of Micro- and Nanosciences, Aalto University.ORCID iD: 0000-0002-4569-5788
Department of Micro- and Nanosciences, Aalto University.
Department of Micro- and Nanosciences, Aalto University.
Fraunhofer Institute for Solar Energy Systems (ISE).
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2013 (English)In: Physica Status Solidi. Rapid Research Letters, ISSN 1862-6254, E-ISSN 1862-6270, Vol. 7, no 4, p. 262-264Article in journal (Refereed) Published
Place, publisher, year, edition, pages
Wiley-VCH Verlagsgesellschaft, 2013. Vol. 7, no 4, p. 262-264
Keywords [en]
degradation, lifetime, silicon, gallium, copper
National Category
Condensed Matter Physics
Research subject
Physics
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URN: urn:nbn:se:kau:diva-37263DOI: 10.1002/pssr.201307011OAI: oai:DiVA.org:kau-37263DiVA, id: diva2:844077
Available from: 2015-08-03 Created: 2015-08-03 Last updated: 2020-05-13Bibliographically approved

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Publisher's full texthttp://dx.doi.org/10.1002/pssr.201307011

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Lindroos, Jeanette

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