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In-Situ TEM Characterization of the Effect of Interfaces on Charge Transport in Cu (In, Ga) Se2 Thin Film Solar Cells
Chalmers University of Technology, Gothenburg.
FEI Company, Eindhoven, Netherlands.
Karlstad University, Faculty of Technology and Science, Department of Physics and Electrical Engineering. (Materialfysik)ORCID iD: 0000-0003-1711-5595
Chalmers University of Technology, Gothenburg.
2009 (English)In: Microscopy and Microanalysis, ISSN 1431-9276, 1435-8115, Vol. 15, 712-713 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
Cambridge, 2009. Vol. 15, 712-713 p.
National Category
Physical Sciences
Research subject
Physics
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URN: urn:nbn:se:kau:diva-15986DOI: 10.1017/S1431927609097980OAI: oai:DiVA.org:kau-15986DiVA: diva2:573148
Available from: 2012-11-29 Created: 2012-11-29 Last updated: 2014-10-28Bibliographically approved

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CiteExportLink to record
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