Automated and Systematic Digital Twins Testing for Industrial ProcessesShow others and affiliations
2023 (English)In: Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023, Institute of Electrical and Electronics Engineers (IEEE), 2023, p. 149-158Conference paper, Published paper (Refereed)
Abstract [en]
Digital twins (DT) of industrial processes have become increasingly important. They aim to digitally represent the physical world to help evaluate, optimize, and predict physical processes and behaviors. Therefore, DT is a vital tool to improve production automation through digitalization and becomes more sophisticated due to rapidly evolving simulation and modeling capabilities, integration of IoT sensors with DT, and high-capacity cloud/edge computing infrastructure. However, the fidelity and reliability of DT software are essential to represent the physical world. This paper shows an automated and systematic test architecture for DT that correlates DT states with real-time sensor data from a production line in the forging industry. Our evaluation shows that the architecture can significantly accelerate the automatic DT testing process and improve its reliability. A systematic online DT testing method can significantly detect the performance shift and continuously improve the DT’s fidelity. The snapshot creation methodology and testing agent architecture can be an inspiration and can be generally applicable to other industrial processes that use DT to generalize their automated testing.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2023. p. 149-158
Keywords [en]
Automation, E-learning, Industry 4.0, Reinforcement learning, Software reliability, Industrial processs, Machine-learning, Modelling capabilities, Physical behaviors, Physical process, Physical world, Production automation, Reinforcement learnings, Simulation and modeling, Software testings, Software testing
National Category
Computer Sciences
Research subject
Computer Science
Identifiers
URN: urn:nbn:se:kau:diva-96056DOI: 10.1109/ICSTW58534.2023.00037Scopus ID: 2-s2.0-85163093915ISBN: 979-8-3503-3335-0 (electronic)OAI: oai:DiVA.org:kau-96056DiVA, id: diva2:1781329
Conference
16th IEEE International Conference on Software Testing, Verification and Validation Workshops, Dublin,Ireland, April 16-20, 2023.
Funder
Knowledge FoundationVinnova2023-07-072023-07-072023-08-07Bibliographically approved