Overview of Test Coverage Criteria for Test Case Generation from Finite State Machines Modelled as Directed Graphs
2022 (English)In: Proceedings - 2022 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2022, Institute of Electrical and Electronics Engineers (IEEE), 2022, p. 207-214Conference paper, Published paper (Refereed)
Abstract [en]
Test Coverage criteria are an essential concept for test engineers when generating the test cases from a System Under Test model. They are routinely used in test case generation for user interfaces, middleware, and back-end system parts for software, electronics, or Internet of Things (IoT) systems. Test Coverage criteria define the number of actions or combinations by which a system is tested, informally determining a potential "strength"of a test set. As no previous study summarized all commonly used test coverage criteria for Finite State Machines and comprehensively discussed them regarding their subsumption, equivalence, or non-comparability, this paper provides this overview. In this study, 14 most common test coverage criteria and seven of their synonyms for Finite State Machines defined via a directed graph are summarized and compared. The results give researchers and industry testing engineers a helpful overview when setting a software-based or IoT system test strategy.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2022. p. 207-214
Keywords [en]
Internet of things; Middleware; Model checking; Software testing; Testing; User interfaces, Finite states machine; Model based testing; Software testings; System models; Systems under tests; Test case; Test case generation; Test coverage criteria; Test engineers; Test models, Directed graphs
National Category
Software Engineering Computer Sciences Language Technology (Computational Linguistics)
Research subject
Computer Science
Identifiers
URN: urn:nbn:se:kau:diva-91721DOI: 10.1109/ICSTW55395.2022.00044ISI: 000861805200031Scopus ID: 2-s2.0-85133269227OAI: oai:DiVA.org:kau-91721DiVA, id: diva2:1692268
Conference
15th IEEE International Conference on Software Testing, Verification and Validation (ICST), Valencia, Spain, [DIGITAL], April 04-13, 2022.
Funder
Knowledge Foundation, 202000672022-09-012022-09-012022-10-25Bibliographically approved