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Nanoscale Structural Damage due to Focused Ion Beam Milling of Silicon with Ga ions
University of Oxford, Engineering Science Department.
University of Oxford, Engineering Science Department.
University of Oxford, Engineering Science Department.
University of Oxford, Engineering Science Department.
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2018 (English)In: Materials letters (General ed.), ISSN 0167-577X, E-ISSN 1873-4979, Vol. 13, p. 346-349Article in journal (Refereed) Published
Place, publisher, year, edition, pages
Elsevier, 2018. Vol. 13, p. 346-349
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Materials Engineering
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URN: urn:nbn:se:kau:diva-65234DOI: 10.1016/j.matlet.2017.11.043OAI: oai:DiVA.org:kau-65234DiVA, id: diva2:1158117
Available from: 2017-11-17 Created: 2017-11-17 Last updated: 2018-06-25Bibliographically approved

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Mousavi, Mahmoud

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Department of Engineering and Physics (from 2013)
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