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Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser
KTH.
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2012 (English)In: Optics Letters, ISSN 0146-9592, E-ISSN 1539-4794, Vol. 37, no 24, p. 5046-5048Article in journal (Refereed) Published
Abstract [en]

We demonstrate the use of the classical Ronchi test to characterize aberrations in focusing optics at a hard x-ray free-electron laser. A grating is placed close to the focus and the interference between the different orders after the grating is observed in the far field. Any aberrations in the beam or the optics will distort the interference fringes. The methodis simple to implement and can provide single-shot information about the focusing quality. We used the Ronchi test to measure the aberrations in a nanofocusing Fresnel zone plate at the Linac Coherent Light Source at 8.194 keV.

Place, publisher, year, edition, pages
Optical Society of America, 2012. Vol. 37, no 24, p. 5046-5048
Keywords [en]
Different order, Far field, Focusing optics, Fresnel zone plate, Hard X ray, Interference fringe, Linac Coherent Light Source, Nano-focusing, Ronchi test, Single-shot, Lasers, Light sources, Optics
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Other Physics Topics
Research subject
Physics
Identifiers
URN: urn:nbn:se:kau:diva-63915DOI: 10.1364/OL.37.005046ISI: 000312707600008Scopus ID: 2-s2.0-84871311756OAI: oai:DiVA.org:kau-63915DiVA, id: diva2:1143798
Funder
Swedish Research CouncilAvailable from: 2017-09-22 Created: 2017-09-22 Last updated: 2017-10-09Bibliographically approved

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Holmberg, AndersHertz, Hans M.Vogt, Ulrich
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